Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample surface using tapping mode feedback. This allows for stability during ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared ...

A common lab setup can inflate 2D transistor performance by up to five times, raising questions about how future chips are ...

It’s called NanoFab Reflection. It’s expected to cost $614 million to build and is part of a $10 billion computer chip ...

Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.

For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.