Abstract: The quality of semiconductor fabrication processes is typically degraded by variations in the manufacturing environment, which can be suppressed by run-to-run (R2R) control schemes. The ...
Fractilia, the industry leader in high-accuracy stochastics metrology and control, today announced that its FAME 300(TM) system has been adopted for production use by a top-five semiconductor device ...
Sliding Mode Control Strategy of Spinning Electrodynamic Tether Formation During Its Spin-Up Process
Abstract: This article mainly studies the spin-up control of a spinning electrodynamic tether formation (SEDTF) consisting of three linearly distributed nanosatellites connected by two tethers. The ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results