Abstract: This article investigates the failure mechanisms of the gallium nitride high electron mobility transistors (GaN HEMTs) under overcurrent stress. The overcurrent behavior of GaN hybrid ...
Abstract: In this paper, an integrated, simulation-driven model-based safety analysis (MBSA) approach that supports the failure modes and effects analysis (FMEA) of system architecture models is ...
Computational neuroscience has traditionally focused on isolated scales, limiting understanding of brain function across multiple levels. While microscopic models capture biophysical details of ...
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