Abstract: The single event upset (SEU) in integrated circuit (IC) occurs due to the striking of heavy charged particles. It results in the multiple node upset (MNU) problem frequently, with the ...
Abstract: Several monitoring, protection, and control applications designed for modern power grids are based on detailed grid models and thus require accurate knowledge of line parameters. A ...
A critical sandbox escape vulnerability has been disclosed in the popular vm2 Node.js library that, if successfully exploited, could allow attackers to run arbitrary code on the underlying operating ...
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