AZoM on MSN

Imaging silicon defects using Raman and PL multivariate imaging

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
IEEE

Dimension Reduction for Hyperspectral Image Classification Based on Sparse Spectral Spatial Locality Preserving Projection

Abstract: As a dimensionality reduction method, local preserving projection (LPP) performs well in many high-dimensional data tasks, but there are some limitations in dimensionality reduction of ...
IEEE

Privacy-Preserving, Efficient and Accurate Dimensionality Reduction

Abstract: The swift evolution of artificial intelligence and big data has dramatically increased data volume and computational complexity, thereby considerably escalating data storage and processing ...