A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...
There's a fundamental shift in what's possible on the factory floor and it's being transformed by embedded AI, agentic ...
Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...
Abstract: Product defect detection (PDD) is a critical industrial Big Data application that leverages social media text mining to identify product defects. However, existing PDD approaches face ...
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