Abstract: Voids, cracks, and insufficient TIM volume hinder heat dissipation and jeopardize reliability of lidded high-performance microprocessors. Non-destructive tests can effectively inspect ...
Researchers at Seoul National University and Sejong University published “Interface dipole modulation for gate dielectrics in Field-Effect transistors: a review.” “Interface dipole engineering has ...
Abstract: Aiming at the problem that the interlocking station data required by the automatic computer interlocking test software relies on manual entry by hand and has a low accuracy rate, this paper ...
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