Abstract: The threshold voltage shift issue caused by traps in silicon carbide metal-oxide-semiconductor field-effect transistors (SiC MOSFETs) is studied based on transient current method. Experiment ...
The X logo appears on a smartphone screen. (Photo by Nikolas Kokovlis/NurPhoto via Getty Images) (NurPhoto via Getty Images) When X's engineering team published the code that powers the platform's ...
Abstract: This paper presents a deconvolution algorithm for high resolution acoustic imaging, specifically tailored for small-element acoustic vector-sensor (AVS) arrays. While existing fourth-order ...
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