Abstract: This article presents a wideband 12 bit 6 GS/s time-interleaved (TI) successive approximation register (SAR) analog-to-digital converter (ADC) implemented in a 28 nm CMOS technology ...
Abstract: This paper introduces a novel closed-loop testing methodology for efficient linearity testing of high-resolution Successive Approximation Register (SAR) Analog-to-Digital Converters (ADCs).
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