A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips. Researchers at Cornell University have achieved something chipmakers have ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

Industrial quality inspection plays a critical role in manufacturing, from ensuring the reliability of electronics and vehicles to preventing costly failures in aerospace and energy systems.

With wearable Internet of Things devices, such as smartwatches, contact with skin adds a new layer of complexity. .