Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

A research team has developed a technology to precisely control the concentration of anion defects in eco-friendly quantum dots through joint research. Through this technology, the research team ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips ...

Breakthrough in solar hydrogen production efficiency of heavy-metal-free eco-friendly quantum dots through anion defect control - Demonstrates commercialization potential of sustainable energy ...