Interesting Engineering on MSN
Ultra-thin electronics to become more efficient with US researchers’ technique to spot defects
Researchers in the United States have developed a new technique that can spot hidden ...
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...
Researchers have shown that hard-to-spot defects in a widely used two-dimensional insulator can trap electrical charges and locally weaken the material, making it more likely to fail at lower voltages ...
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