Electronic Specifier

Free tool simplifies signal path design for electronic test systems

Pickering Interfaces has launched Test System Architect (TSA), a free, online tool designed to solve signal path problems.
EDN

Take scan test out of the critical path

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Electronic Design

Learn ABCs Of JTAG Boundary-Scan Testing With Software Bundle

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...
EDN

AC scan can do nano-scale device testing

Huge transistor counts, rising on-chip clock rates, relentlessly escalating levels of integration in systems-on-chip, and new types of defects seen in deep-submicron and nanometer processes are ...