IEEE

Data processing, analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube mode: conduction of a nanomaterial for Lithium-ion battery electrodes

Abstract: With the increasing integration of functional systems, nanoscale characterization has become crucial not only for material investigation but also for advancing the understanding of local ...
IEEE

Tutorial on Empirical Mode Decomposition: Basis Decomposition and Frequency Adaptive Graduation in Non-Stationary Time Series

Abstract: This tutorial explores the class of non-parametric time series basis decomposition methods particularly suited for nonstationary time series known as Empirical Mode Decomposition (EMD). In ...