Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
Interesting Engineering on MSN
Ultra-thin electronics to become more efficient with US researchers’ technique to spot defects
Researchers in the United States have developed a new technique that can spot hidden ...
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...
David leads the editorial team at CNET. We create expert reviews, articles and video on every aspect of technology, from AI to Zoox. We are thoroughly, proudly human. Expertise A 25-year CNET veteran, ...
We independently review everything we recommend. When you buy through our links, we may earn a commission. Learn more› By Andrea Barnes Andrea Barnes is a writer covering large cleaning appliances.
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