Abstract: Wafer defect detection is a crucial step in semiconductor manufacturing to ensure the high yield and to reduce inspection errors. Failing to detect defects can lead to huge losses in ...
Abstract: The paper proposes using ResNet-50 and Vision Transformer (ViT) together to improve classification of diseases affecting the eye. This important architecture, resnet50, is used for excellent ...
Stimulus-based interventions using content with a positive body image or that did not focus on appearance were also identified, achieving moderate effects (ηp²<.07), as well as combined approaches ...
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