Eddy current testing is a well-established method of nondestructive testing that is used to examine nonferrous/nonmagnetic materials such as condenser and heat exchanger tubes in power generation ...
Several companies are developing or shipping next-generation e-beam inspection systems in an effort to reduce defects in advanced logic and memory chips. Vendors are taking two approaches with these ...
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Cutting-edge imaging and faster algorithms for finding minuscule defects in semiconductor chips
A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...
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Ultra-thin electronics to become more efficient with US researchers’ technique to spot defects
Researchers in the United States have developed a new technique that can spot hidden ...
Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal ...
A joint research team led by Dr. Hee-Eun Song of the Photovoltaics Research Department at the Korea Institute of Energy Research (President Yi Chang-Keun, hereafter “KIER”) and Prof. Ka-Hyun Kim of ...
SPONSORED: Quality control and efficient O&M of rooftop commercial PV installations are economic and technical challenges, but essential nonetheless. The key objective in conducting O&M is to ensure ...
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