IEEE

From Sample Poverty to Rich Feature Learning: A New Metric Learning Method for Few-Shot Classification

Abstract: With the rapid development of deep learning in the field of computer vision, few-shot learning has emerged as an effective approach to tackle the challenge of data scarcity, garnering ...
IEEE

Methods for Short-term Wind Power Forecasting under Small Sample Conditions of Extreme Weather such as Cold Waves

Abstract: Extreme weather events such as cold waves pose significant challenges to the safe operation of wind power and new types of power systems dominated by wind power. Providing accurate wind ...

Quantum algorithm beats classical tools on complement sampling tasks

Quantum computers—devices that process information using quantum mechanical effects—have long been expected to outperform classical systems on certain tasks. Over the past few decades, researchers ...

Probability underlies much of the modern world—an engineering professor explains how it actually works

Probability underpins AI, cryptography and statistics. However, as the philosopher Bertrand Russell said, "Probability is the most important concept in modern science, especially as nobody has the ...