IEEE

Semi-Supervised Learning Under Extreme Class Imbalance in Wafer Bin Map Defect Pattern Classification

Abstract: The semiconductor industry faces significant challenges in wafer quality assessment due to the increasing complexity of device fabrication and the rise in inline defects and circuit failures ...
IEEE

EEG Signal Classification for Epileptic Seizure Detection Using Multi Class Convolutional Neural Network Compared with Statistical Pattern Recognition

Abstract: This project's primary goal is to use Multi Class Convolution Neural Network to detect epileptic seizures. The effectiveness of the suggested method for detecting epileptic seizures is ...