IEEE

A Neural-Network-Based Statistical Compact Model Using a Variational Autoencoder for Emerging Transistors

Abstract: Emerging transistors lack the statistical compact models needed to evaluate the yield of integrated circuits. To address this, we propose a novel framework combining a variational ...
IEEE

Wafer-level Heterogeneous Integration of GaN NMOS and CNT PMOS Transistors Using Direct-Immersion Technology

Abstract: In this letter, we demonstrate wafer-level heterogeneous integration of GaN and carbon nanotube (CNT). The work reports the integration of GaN and CNT with minimal device performance ...