The automatic detection of surface-level irregularities—defects or anomalies—in 3D data is of significant interest for various real-world purposes, such as industrial quality inspection, ...
Abstract: To address the challenges of low accuracy in radar signal sorting under complex electromagnetic environments, the difficulty in setting priori parameters for DBSCAN clustering algorithms, ...
Abstract: Silicon carbide (SiC) MOSFETs, with their outstanding performance, have found wide applications in high-frequency and high-temperature fields, particularly demonstrating significant ...
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