Researchers have discovered a novel way to manipulate defects in semiconductors. The study holds promising opportunities for novel forms of precision sensing, or the transfer of quantum information ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Description: Structures and interactions of point, line, and planar defects in solids, with emphasis on properties of defects. Generic basis of defect energies and interactions, with reference to ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...