When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Electronics design and testing were once two distinct functions where an electronic design was breadboarded and populated ...

In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

Virtual system integration and test using Model-Based Design uncovers errors introduced in the requirements and design phases of embedded system development, well before the physical testing phase. As ...

What are the challenges of incorporating testing and chiplets? What is a typical test configuration for testing chiplets? 1. Keysight’s M800 series bit-error-ratio testers (BERTs) support NRZ and PAM4 ...