Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly sensitive surface analysis technique that provides elemental, chemical state, and molecular information from solid material ...
A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...
The lifespan of lithium-ion batteries (LIBs) and the related capacity fade are primarily influenced by the degradation of electrodes due to the deactivation of active materials. Studying this ...
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