Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...
An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
AFM can provide new insights into 2D materials to better understand their potential applications. 2D materials, such as graphene and hexagonal boron nitride (hBN), have unusual features because they ...
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