Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
How GaN provides superior power designs compared to silicon. Why LLC resonant topologies are best. Traditional power transistors have long contributed to power losses (aka lower efficiency) in ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results