After a youth spent playing with Amigas and getting into all sorts of trouble on the school computer network, I’ve always had a soft spot in my heart for hardware from the 80s and 90s. This extends ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

As the transistor geometry shrinks, more transistors are packed on to a single chip, reducing manufacturing cost on a per-transistor basis. The result, however, is more transistors to test; hence, ...

So I'm trying to detect through Visual Basic 6.0 when a voltage change occurs on one of the pins of the serial/parallel port. The whole thing is pretty simple; no data transfer/handshaking/etc needs ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...