Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...
A version of this article also appeared in the May 2012 issue of Test & Measurement World. See the PDF. Test engineers have used open standard interfaces since1975, when the IEEE approved IEEE 488, ...
With each passing year, modular instruments gain ever-more capabilities that were once only possible with benchtop instruments. Assembling a complete test system once required a rack-mount enclosure ...
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