This article discusses some of the fundamental research and development challenges in both the digital and RF/millimeter wave domains (such as waveform generation, receiver algorithms and ...

Microprocessor testing and self-test techniques constitute a critical domain in ensuring the reliability and performance of modern computing devices. These methodologies encompass both hardware and ...

The floodgates for chiplet-based design have officially opened. Over the past several quarters, manufacturing test flows have been validating 2.5D package architectures, and production volumes are ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

In my previous post, I looked at federation, services and events as ways of achieving real-time data integration. TDWI’s Phillip Russom identified these as the three “most aggressively adopted” ...