Until the mid-1970s, compression testing of composite materials received relatively little attention. Up to that point it, had generally been assumed that the compressive stiffness was approximately ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...