Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
At this year’s International Test Conference (October 10-15, 2021), Siemens Digital Industries Software is showcasing IC test and lifecycle management technologies that address the key scaling ...
BALTIMORE — The marriage of design-for-test (DFT) software with test hardware may drastically lower the cost of test, according to several companies that will present their plans at this week's ...
Huge transistor counts, rising on-chip clock rates, the relentlessly escalating levels of integration in systems-on-chip, and the new types of defects seen in deep-submicron and nanometer processes ...
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